Methods for improving the testing of digital systems
Keywords:
SiP, SoC, defects,testing, digital systems, synthesis, truth table
Abstract
The article examines the latest research of Design & Test technology, deductive parallel modeling of the malfunction of digital systems, classifies existing solutions for improving the testing of digital systems, proposes a generalized model of deductive parallel analysis of digital systems, presents an internal model and data structures for the analysis of a digital device, proposes deductive defect analysis, the synthesis of the deductive function with the help of the truth table.
References
1. Ziad Noun. Wireless Approach for SIP and SOC Testing. Micro and nanotechnologies/Microelectronics. Université Montpellier II - Sciences et Techniques du Languedoc. English.
2. Литвинова Е.И. Технологии встроенного тестирования system-in-package.
3. Каравай М.Ф. Алгоритм построения проверяющего теста для кратных неиспраностей по структуре комбинационного устройства.
4. Олиховский С. Й., Белова М. М., Кочелаб Е. В. Кинетика образования и роста микродефектов в кристаллах. URL: https://www.researchgate.net/../Kinetics-of-nucleation-and-growth-of-microdefects-in-crystals-in-Russian.pdf (Дата звернення 15.05.2023).
5. Appello D., Bernardi P., Grosso M., Reorda M.S. System-in-package testing: problems and solutions // IEEE Design & Test of Computers. Vol. 23, Issue 3. May-June, 2021. Р. 203 – 211.
2. Литвинова Е.И. Технологии встроенного тестирования system-in-package.
3. Каравай М.Ф. Алгоритм построения проверяющего теста для кратных неиспраностей по структуре комбинационного устройства.
4. Олиховский С. Й., Белова М. М., Кочелаб Е. В. Кинетика образования и роста микродефектов в кристаллах. URL: https://www.researchgate.net/../Kinetics-of-nucleation-and-growth-of-microdefects-in-crystals-in-Russian.pdf (Дата звернення 15.05.2023).
5. Appello D., Bernardi P., Grosso M., Reorda M.S. System-in-package testing: problems and solutions // IEEE Design & Test of Computers. Vol. 23, Issue 3. May-June, 2021. Р. 203 – 211.
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Published
2023-06-22
How to Cite
Kardashuk, V., Bortnyk, K., & Bahnіuk N. (2023). Methods for improving the testing of digital systems. COMPUTER-INTEGRATED TECHNOLOGIES: EDUCATION, SCIENCE, PRODUCTION, (51), 43-51. https://doi.org/10.36910/6775-2524-0560-2023-51-06
Section
Computer science and computer engineering
